| Title: | SOFTWARE RELIABILITY GROWTH MODELING FOR EXPONENTIATED WEIBULL FUNCTION WITH ACTUAL SOFTWARE FAILURES DATA |
| DOI No: | 10.1142/9781860948534_0062 |
| Source: | INNOVATIVE APPLICATIONS OF INFORMATION TECHNOLOGY FOR THE DEVELOPING WORLD (pp 390-395)
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| Author(s): | M. U. BOKHARI
Department of Computer Science, Aligarh Muslim University, Aligarh, India
N. AHMAD
University Department of Statistics and Computer Applications, T. M. Bhagalpur University, Bhagalpur-812007, India
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| Abstract: | A number of testing-effort functions for modeling software reliability growth based on non-homogeneous Poisson process (NHPP) have been proposed in the past decade. Although these models are quite helpful for software developers and have been widely applied in the industries or research centers, we still need to put more testing-effort function into software reliability growth model for accuracy on estimate of the parameters. In this paper, we will consider the case where the time dependent behaviors of testing-effort expenditures are described by Exponentiated-Weibull (EW) curves. Software Reliability Growth Models (SRGM) based on the NHPP are developed which incorporates the EW testing-effort expenditure during the software-testing phase. It is assume that the error detection rate to the amount of testing-effort spent during the testing phase is proportional to the current error content. For the models, the software reliability measures such as the number of remaining faults, fault detection rate and the estimation methods of the model parameters by Least Square and Maximum Likelihood are investigated through three numerical experiments on real data from various software projects. The evaluation results are analyzed and compared with other existing models to show that the proposed SRGM with EW testing-effort has a fairly better faults prediction capability and it depicts the real-life situation more faithfully. This model can be applied to a wide range of software system. In addition, the optimal release policy for this model, based on reliability criterion is discussed. |
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