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| Title: | ANALYSIS BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROSCOPY FOR NUCLEAR PRODUCTS IN HYDROGEN PENETRATION THROUGH PALLADIUM | |
| DOI No: | 10.1142/9789812701510_0038 | |
| Source: | CONDENSED MATTER NUCLEAR SCIENCE (pp 455-462) | |
| Author(s): | H. YAMADA
Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan S. NARITA Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan H. ONODERA Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan H. SUZUKI Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan N. TANAKA Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan T. NYUI Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan T. USHIROZAWA Department of Electrical and Electronic Engineering, Iwate University, Ueda 4-3-5, Morioka 020-8551, Japan |
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| Abstract: | Elemental analysis was performed for the palladium foil through which the hydrogen gas penetrated. We analyzed sample surface by time-of-flight secondary ion mass spectroscopy and searched for newly produced elements during the gas permeation process. Significant increase of the counts for Cr, Fe, Cu and Ag were found after the permeation. These elements could have been produced by nuclear transmutation. | |
| Full Text: | View full text in PDF format (438KB) | |
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