REVERSIBLE OPTICAL RECORDING ON A CdSe/ZnS NANOCRYSTAL THIN FILM

Title:

REVERSIBLE OPTICAL RECORDING ON A CdSe/ZnS NANOCRYSTAL THIN FILM
This work is supported by both "Nanotechnology Materials Program-Nanotechnology Particle Project" of the New Energy and Industrial Technology Development Organization (NEDO) and Grants-in-Aid for Scientific Research from the Ministry of Education, Culture, Sports, Science and Technology, Japan (MEXT).

DOI No:

10.1142/9789812701879_0034

Source:

CLUSTERS AND NANO-ASSEMBLIES (pp 295-300)

Author(s):

TAKAFUMI UEMATSU
Department of Chemical Engineering, the University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan
JUNICHI KIMURA
Department of Chemical Engineering, the University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan
SHINYA MAENOSONO
Department of Chemical Engineering, the University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan
YUKIO YAMAGUCHI
Department of Chemical Engineering, the University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan

Abstract:

Here we report that reversible and multi-digital recording on a CdSe/ZnS core/shell nanocrystal (NC) thin film by using confocal laser scanning microscope. After a 7.4μm-squared area on the NC film was excited by strong light (11 to 1370 nW) under dry-N₂ atmosphere, a 60μm-squared area including the pre-excited region was scanned by weak light (ca. 0.6 nW) to visualize the photoluminescence (PL) intensity difference between pre- and non-excited regions. The PL intensity on pre-excited area increased with excitation energy, and finally saturated. The saturated increment of the PL intensity increases with decreasing the pre-excitation intensity. In addition, the PL increment reversibly changes with excitation intensity. The results imply that both the storage and clearing of data (i.e. PL intensity) can be operated by single excitation wavelength.

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