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| Title: | MEASURING OF THE NONLINEAR OPTICAL CONSTANTS OF LOW DIMENSIONAL THIN FILM STRUCTURES | |
| DOI No: | 10.1142/9789812701947_0016 | |
| Source: | PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES (pp 92-95) | |
| Author(s): | A. V. KHOMCHENKO
Institute of Applied Optics of NASB, Mogilev, Belarus A. B. SOTSKY Institute of Applied Optics of NASB, Mogilev, Belarus E. O. KOTYASHEV Institute of Applied Optics of NASB, Mogilev, Belarus E. V. GLAZUNOV Institute of Applied Optics of NASB, Mogilev, Belarus |
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| Abstract: | A new technique for measuring the nonlinear refractive index and absorption coefficient of thin film structures is presented. It is based on the analysis of the two-dimensional spatial intensity distribution of the reflected laser beam in excitation of the lightmode in nonlinear dielectric structures doped by CdSe nanocrystals. | |
| Full Text: | View full text in PDF format (222KB) | |
| TOC: | Back to Table of Contents | |
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