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Title:COMPARATIVE ANALYSIS OF AFM PROBE TIP MODIFICATION WITH CARBON NANOTUBES
DOI No:10.1142/9789812701947_0053
Source:PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES (pp 240-242)
Author(s):S. A. CHIZHIK
A. V. Lykov Heat and Mass Transfer Institute NASB, 15 P. Brovky Street, Minsk, Belarus

S. O. ABETKOVSKAYA
A. V. Lykov Heat and Mass Transfer Institute NASB, 15 P. Brovky Street, Minsk, Belarus

I. A. ZHUKOVA
A. V. Lykov Heat and Mass Transfer Institute NASB, 15 P. Brovky Street, Minsk, Belarus

A. E. SHASHKOV
A. V. Lykov Heat and Mass Transfer Institute NASB, 15 P. Brovky Street, Minsk, Belarus

S. A. ZHDANOK
A. V. Lykov Heat and Mass Transfer Institute NASB, 15 P. Brovky Street, Minsk, Belarus

Abstract:The paper describes reproducible creation of probe tips of carbon nanotubes for a use in an atomic force microscope (AFM). Existing ways of the AFM probe tip modification have been reviewed. Experiments implementing two selected approaches: growing of nanotubes on the tips and transfer of carbon nanostructures on to the tip from a suspension. TEM and AFM analysis showed that the precalibrated carbon nanostrucures are advantageous for the probe tip modification.
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