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| Title: | POLYMERS AS SURFACE MODIFIERS FOR PREPARATION OF CoPt3 NANOPARTICLE MONOLAYER FILMS | |
| DOI No: | 10.1142/9789812701947_0077 | |
| Source: | PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES (pp 349-352) | |
| Author(s): | V. ALEKSANDROVIC
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany M. STOLZENBURG Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany I. RANDJELOVIC Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany A. KORNOWSKI Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany S. FÖRSTER Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany H. WELLER Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany J. I. FLEGE Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany TH. SCHMIDT Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany G. ALEXE Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany T. CLAUSEN Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany J. FALTA Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany S. BERNSTORFF Sinchrotrone Trieste, Strada Statale 14, km 163.5, 34012 Basovizza / Trieste, Italy |
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| Abstract: | To fabricate a well-ordered monolayer of CoPt3 nanoparticles that covers large areas a spin coating technique was used. Prior to particle deposition poly(vinyl pyridine) (PVP) and poly(ethylen oxide) (PEO) were used as surface modifiers of oxidized silicon wafers. Grazing incidence small-angle X-ray scattering, atomic force and electron scanning microscopy were used to characterize the polymer and particle layers and to study the influence of polymers as substrate modifiers on the particle packing. | |
| Full Text: | View full text in PDF format (393KB) | |
| TOC: | Back to Table of Contents | |
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